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IoTMap : testing in an IoT environment / Tom van de Ven, Jaap Bloem, Jean-Pascal Duniau. - Vianen : Sogeti, 2016. - 160 stron : ilustracje ; 23 cm.
Author
Van de ven Tom. Autor Bloem Jaap. Autor Duniau Jean-Pascal. Autor
Form of Work
Książki
Subject
Informatyka Internet Biznes
Domain
Informatyka i technologie informacyjne
Customer Service eXperience Connect-Talk-Think-Act lnternet of Things loT Model loT Loyers Blueprint embedded system An loT Test Approoch in Five Steps Test the loT loyers Combine loT test expertise Choose loT test environment(s) Choose the right quality attributes Choose building blocks Quick Tech Testing Shift domain knowledge'łesting to test croftsmonship test! From prognostic testing to o hightech test plan Now is the time for automotion Hightech test vision The loT perspective High-Tech Test Automotion lmplement test outomotion in five steps RedPrint for o highłech test outomotion fromework Phosed model for implementotion of hightech automated testing Building Blocks Crowd testing Explorotory testing Artificial lntelligence ond testing Evolutionory algorithms Statistical Usage Testing End to-end testing Storytelling lnteroperability testing Testing of complionce to standards Testing for Physics and Systems lntroduction to TEPS Apply TEPS to loT Testing TEPS 7 step approach The feedback loop Capitalization: continuous improvement Synthesis table of the process TEPS key areas A loT Quolity Attributes (High-Tech) Test Automation Checklist TEPS Checklist.
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